The success of today's high-speed digital and RF circuit designs highly depends on model and measurement accuracy including package characterization. Since the package operates in a complex electrical environment, accurate characterization requires a multi-level approach. Amkor's approach consists of a mix of electrical models based on 2-D / 3-D and Full Wave 3-D package simulations in addition to time and frequency domain measurements. 2-D simulation and measurement based design guidelines are used for pre-layout feasibility and layout design rule generation whereas 3-D lumped, Full Wave 3-D and measurements are reserved for post-layout performance characterization and verification to ensure the design meets electrical specifications.
As the data transfer rate, gate counts and circuit density continue to grow, the impact of package electrical performance on overall system performance is growing. Today, delivering an optimum package requires more than just a robust layout and post-layout electrical simulation; it requires close interaction with our customers and substantial engineering support during layout phase. Amkor's Application Engineering and Characterization group closely works with the package designer to make sure the package layout meets all signal integrity performance specifications. You can trust Amkor to select and design the best package for your application and verify package electrical performance through state of the art simulation and measurement tools and techniques.
Amkor's Electrical Characterization Lab offers complete and accurate high frequency package characterization services. Amkor employs real time data acquisition either from a network analyzer or TDR (Time Domain Reflectometry) and uses a variety of high frequency EDA tools such as Agilent-ADS (Advanced Design System) and TDA Systems I-Connect to generate interconnect models based on measurement data.
Amkor's Application Engineering and Characterization group addresses the need for higher performance packaging through package co-design, measurement and simulation. To deliver an optimum design, Amkor utilizes measurement based design guidelines that have been developed over the years and extensive post-design modeling and measurements using state-of-the-art tools and techniques for verifications. We recognize that today's fast edges require careful design planning and attention to details. With Amkor's methodology, signal integrity issues such as risetime degradation, crosstalk, I/O bandwidth, power ground noise, time delay and ringing can be predicted before expensive prototypes are built.
As signal rise times decrease and operating frequencies increase, signal fidelity becomes difficult to control. At Amkor, we have highly integrated signal integrity analysis capabilities to perform board/system level simulation. Packages are characterized with multiple signal integrity runs by varying the rise time, number of power/ground solder balls, number of simultaneously switching signals, etc. This provides our customers with the best-fit package for their customized Integrated Circuits. Signal degradation due to impedance mismatches, crosstalk, and simultaneous switching noise from the package can be evaluated and the package design can be modified to meet performance specifications. Amkor uses highly accurate 2-D/3-D-field solvers and Cadence's Advanced APE for signal integrity analysis. The 3-D-field solver extracts resistance, capacitance and inductance in both lumped and distributed form to achieve the highest accuracy. Cadence's APE is used for delay optimization, crosstalk, reflection, impedance and 2-D parasitic extraction. Since Cadence's APE is tightly integrated with the layout tool, electrical rules can be passed to layout team before and during the design process restricting electrical rule design violations allowing for quicker design turnaround times.
For more information on our Electrical Package Characterization services, please contact an Amkor Regional Sales Office near you, your Account Manager or fill out the Request for Additional Information Form.