Amkor offers complete, cost-effective RF Test / Wireless Test services to customers seeking a direct path from first silicon to production. Our dedicated IC test development group has the experience, skills and equipment to accommodate customers’ sophisticated wireless test requirements for current and emerging communications standards, as well as traditional RF / Wireless component level tests.

Examples of our successful ATE development projects:
  • GPS
  • Bluetooth
  • WLAN
  • DVB
  • Cellular (CDMA / GSM / WCDMA) products

Wireless stimulus and measurement capabilities:
  • Frequency: DC – 6GHz (multi-port)
  • Modulation: CW and IQ programmable modulation standards (IEEE / ITU)

RF / Wireless component tests (PAs, LNAs, mixers, switches, etc.) include:
  • Power
  • S-parameters
  • Gain
  • Noise figure
  • Harmonics & THD
  • Signal-to-Noise (SNR, SINAD)
  • Second & Third order Intercept
  • EVM

Additional proven supporting IC test capabilities:
  • High-Speed Serial (SATA, PCIe, DDR2/3, USB2, HDMI)
  • Embedded DAC / ADC testing
  • Embedded RAM
  • Test pattern translation (VCD / EVCD, WGL, STIL file inputs with tester binary pattern outputs)
  • Digital pin electronics and relay controls for high pin-count devices
    • Continuity & Leakage
    • DC measurements
    • Functional patterns
    • Serial bus control

IC Test Development Laboratory

We have in-house wafer prober (300mm TEL) and package handler equipment (Seiko-Epson), and state-of-the-art Verigy v93000 SOC PortScale™ ATE equipped for digital, mixed-signal and multi-port RF testing. In addition, we offer local PCB load board, contactor socket and handler interface design capabilities supporting customers seeking a direct path from first silicon to high volume manufacturing qualification and production. Precision laboratory bench equipment and PCB rework facilities complement the ATE development environment.

  • In addition to Verigy v93000 SOC, our factories offer Teradyne UltraFLEX UltraWave™ ATE.
  • Pre-production services include in-house “quick-turn” product screening and engineering sampling.
  • For protocol-aware “system” products, we offer customizable multi-site automated test solutions integrated with a cost-effective PC-based station controller.


Perhaps best of all, we have an experienced, dedicated staff of semiconductor test professionals for product IC test development, integration, debug, correlation and factory release.

Amkor RF Test / Wireless Test Solution Benefits:
  • Competitive cost of test
  • Increase standardization
  • Increase yield
  • Faster test development
  • Better ATE utilization
  • Lower test overhead
  • Lower capitalization cost
  • Qualification and Characterization Services
  • Complete Test Integration Engineering
  • Extensive RF test production experience
  • Strong test equipment roadmap
  • Broad geographical footprint with proximity to foundries, assembly and end customers

RF / Wireless Services:
  • Test and correlation development
  • Socket design and characterization
  • RF SiP module test strategies
  • Wafer probe services including WLCSP, bump and RF
  • Product evaluation
    • Initial product characterization
    • Reference samples correlation
    • Product performance monitoring
  • Reliability and manufacturability
    • Data collection and yield analysis
    • Production support, including failure analysis and line-rejects verification
  • DUT board development
    • Layout
    • Simulation
    • Tuning
    • Correlation

For more information on Amkor's RF Test / Wireless Test services please contact an Amkor Regional Sales Office near you or fill out a request for information.

Test Services